Numerical Modeling; Thickness Dependence of J-V Characteristic for Multi-Layered OLED Device

A numerical model of multi-layered organic light emitting diode (OLED) is presented in this paper. The current density-voltage (JV) model for OLED was performed by using the injection-limited current and bulk-limited current. The mobility equation was based on the field dependent model, so called “Poole-Frenkel mobility model.” The accuracy of this simulation was represented by comparing to the experimental results with a variable of EML thickness of multi-layered OLED device. There are two hetero-junction models which should be dealt with in the simulation. The Langevin recombination rate of electron and hole is also calculated through the device simulation. key words: OLED, fitting parameter, J-V characteristics, device simulation